Search results for "Focused ion beam"
showing 10 items of 25 documents
Thin Film Characterisation Using MeV Ion Beams
2009
This chapter focuses on the characterisation of very thin films having thicknesses from a few nanometres to tens of nanometres. The driving force for the ion beam analysis community has mostly been the rapid development of microelectronics — all the elements in new thin SiO2 replacing dielectrics, diffusion barriers, and silicide contacts need to be analysed with a depth resolution even better than a nanometre. This together with new film deposition techniques like atomic layer deposition (ALD) [1] have given a push to the ion beam analysis community to develop new and better techniques using energetic (>0.5 MeV) ion beams.
Phase and structural transformations in annealed copper coatings in relation to oxide whisker growth
2015
Abstract We describe structural and phase transformation in copper coatings made of microparticles during heating and annealing in air in the temperature range up to 400 °C. Such thermal treatment is accompanied by intensive CuO nanowhisker growth on the coating surface and the formation of the layered oxide phases (Cu 2 O and CuO) in the coating interior. X-ray diffraction and focused ion beam (FIB) are employed to characterize the multilayer structure of annealed copper coatings. Formation of volumetric defects such as voids and cracks in the coating is demonstrated.
Microchemical surface analysis of historic copper-based coins by the combined use of FIB-FESEM-EDX, OM, FTIR spectroscopy and solid-state electrochem…
2019
[EN] A multi-technique strategy, including microscopy, spectroscopic and electrochemical techniques, is proposed to study thin corrosion layers that form on the surface of historic copper-based coins. An accurate characterisation of this external corrosion layer is important for selecting a suitable conservation and/or restoration treatment. For this purpose, a series of copper-based coins from different historical periods and provenances, which mainly exhibited atmospheric corrosion, was analysed. The morphology of the corrosion layer and the upper core of coins was studied in trenches done on coin surfaces with a focused ion beam gun, coupled to a field emission scanning electron microsco…
Measurement of gap between abutment and fixture in dental conical connection implants. A focused ion beam SEM observation
2020
Background The aim of the authors was to examine the abutment-fixture interface in Morse-type conical implants in order to verify gaps at this level using a new microscopical approach. Material and Methods In this in vitro study, 20 abutment-fixture complexes were prepared by sectioning (longitudinal and cross-sectional to the long axis) with a microtome and then with a focused ion beam (FIB). This is a micrometric machine tool that uses gallium ions to abrade circumscribed areas to dig deeper into the cuts obtained with the microtome in order to eliminate cut-induced artifacts. This is because the FIB abrasion is practically free from artifacts, which are normally generated by the action o…
Towards metal chalcogenide nanowire-based colour-sensitive photodetectors
2018
Financial support provided by Scientific Research Project for Students and Young Researchers Nr. SJZ/2016/6 realized at the Institute of Solid State Physics, University of Latvia is greatly acknowledged. Authors are grateful to Reinis Ignatans for XRD measurements.
Ultra-fast direct growth of metallic micro- and nano-structures by focused ion beam irradiation
2019
An ultra-fast method to directly grow metallic micro- and nano-structures is introduced. It relies on a Focused Ion Beam (FIB) and a condensed layer of suitable precursor material formed on the substrate under cryogenic conditions. The technique implies cooling the substrate below the condensation temperature of the gaseous precursor material, subsequently irradiating with ions according to the wanted pattern, and posteriorly heating the substrate above the condensation temperature. Here, using W(CO)6 as the precursor material, a Ga+ FIB, and a substrate temperature of -100 °C, W-C metallic layers and nanowires with resolution down to 38 nm have been grown by Cryogenic Focused Ion Beam Indu…
The Role of Zr in the High-Temperature Oxidation of Fe<sub>3</sub>Al
2008
The paper describes an examination of the effect of the addition of zirconium as a third element on the heat-resisting properties and explains the high temperature oxidation mechanism of Fe3Al intermetallic compounds. The Fe3Al and Fe3Al-0,05Zr specimens have been isothermally oxidized in the temperature range of 1173-1473 K in synthetic air for 100 hrs. The formed oxide layer, about 1,5-2 μm thick, was Al2O3. An examination of the cross-sectioned scales by SEM-EDS showed that the alumina layer consisted of a small inner columnar layer and an outer equiaxed grain layer. Additionally, very fine (50-150 nm) oxide grains rich in Zr, further identified as ZrO2, were found across the alumina sca…
Characterization and differentiation of rock varnish types from different environments by microanalytical techniques
2017
© 2017 Elsevier B.V. We investigated rock varnishes collected from several locations and environments worldwide by a broad range of microanalytical techniques. These techniques were selected to address the challenges posed by the chemical and structural complexity within the micrometer- to nanometer-sized structures in these geological materials. Femtosecond laser ablation-inductively coupled plasma-mass spectrometry (fs LA-ICP-MS), scanning transmission X-ray microscopy-near edge X-ray adsorption fine structure spectroscopy (STXM-NEXAFS) in combination with scanning electron microscopy (SEM) of focused ion beam (FIB) ultra-thin (100–200 nm) sections, conventional and polarization microscop…
Editorial for the Special Issue on Nanofabrication with Focused Electron/Ion Beam Induced Processing
2021
Focused electron beam (FEB) and focused ion beam (FIB) technologies have opened novel paths for material science research and technology at the micro and nano scales in recent decades [...]
Multi-scale characterization of porosity in Boom Clay (HADES-level, Mol, Belgium) using a combination of X-ray μ-CT, 2D BIB-SEM and FIB-SEM tomography
2015
Abstract The Oligocene age Boom Clay is a potential host material for radioactive waste disposal in Belgium. To better understand the physical basis of transport mechanisms of radionuclides, we aim to characterize the pore space and its connectivity at nm-scale in 3D. In the present study, X-ray μ-CT and FIB-SEM (focused ion beam scanning electron microscopy) tomography were combined, to investigate the 3D pore space of a Boom Clay sample from the Mol-1 borehole (depth corresponding to the level of the HADES-URF – ‘high activity disposal experimental site underground research facility’) at the Mol–Dessel research site for radioactive waste disposal (Belgium). BIB-SEM (broad ion beam scannin…